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Linear Scans |
Yes |
Scan Length Range |
500μm(typically, 450μm minimum) |
Data Points Per Scan |
Up to 10,000 points |
Vertical Range |
15μm (typically, 13.5μm minimum) |
Vertical Resolution |
2Å (least significant bit) |
Step Height Repeatability |
1nm (1s on 0.1μm step) or 0.1%, whichever is larger |
Scan Speed |
1 - 100μm/sec |
SYSTEM |
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Targeting Microscopic Camera |
Fixed magnification, 8mm FOV [100X with 15in. Monitor] |
Stylus Radius |
5μm/ 2μm |
Stylus Material |
Diamond coated |
Stylus Force |
0.1 - 50mg |
Sample Stage Dimension |
70x70mm |
Sample Stage Translation |
Manual X/Y, 12mm x 12mm |
Sample Thickness |
10mm |
Sample Weight |
50g |
Computer System Requirement |
CPU: 1GHz; RAM: 2GB; USB 2.0 |
Software |
Scan control software on Windows XP or later Profile measurement software; Report generator software; |
Vibration Detection and Isolation |
Embedded environment vibration detector |
SOFTWARE |
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Step Analysis |
Point-to-point, Avg. step height |
Auto-Leveling |
Yes |
High Order Flatten |
Yes |
Roughness and Waviness Analysis |
Ra, Rq, Rp, Rz, Ry, Rmax, Wa, Wq, Wp, Wz, Wy, Wmax |
Filter |
Moving average, Low pass, High pass |
Raw Data Export |
Yes |
Scan Report Generator |
Yes |
FACILITY REQUIREMENTS |
|
Power |
100 - 240 VAC, 50/60Hz, 100W |
Weight |
10kg |
Temperature Range |
25±2 °C |
Humidity Range |
70%, non-condensing |
IC LMV982MM(NOPB) National Semiconductor